The following represents an incomplete list of items about the analysis of reflectivity data.
Software
NCNR Reflectometry software
fromthe NIST Center for Neutron Research
Parratt32 or the Reflectivity Tool software from the
Hahn-Meitner-Institut
2006
"AND/R: Advanced neutron diffractometer/reflectometer for investigation of thin films and multilayers for the life sciences," Joseph A. Dura, Donald J. Pierce, Charles F. Majkrzak, Nicholas C. Maliszewszkyj, Duncan J. McGillivray, Matthias Loesche, Kevin V. O'Donovan, Mihaela Mihailescu, Ursula Perez-Salas, David L. Worcester, Stephen H. White, Rev. Sci. Instrum. 77, 074301.
2003
"Solution to the Phase Problem for Specular X-Ray or Neutron Reflectivity
from Thin Films on Liquid Surfaces," J. Kent Blasie, Songyan Zheng and
Joseph Strzalka, Phys. Rev. B, 67 224201 (200
3).
Discusses the application of box-refinement to solve the structure of Langmuir monolayers. Introduces obtaining an analytical profile structure from the profile gradient by fititng it to a sum of Gaussian functions that can then be integrated analytically.
2001
"
Structural Studies of the HIV-1 Accessory Protein Vpu in Langmuir Monolayers:
Synchrotron X-Ray Reflectivity," S. Zheng, J. Strzalka, C. Ma, S. J. Opella, B.
M. Ocko, and J. K. Blasie, Biophysical Journal, 80, 1837-1850, 2001.
Presents a more detailed description of the application of box refinement to x-ray reflectivity data from a liquid surface.
2000
"Experimental feasibility of phaseless inverse scattering methods for specular reflectivity" A. van der Lee Eur. Phys. J. B, 13 755-763.
"X-ray Scattering Studies of Maquette Peptide Monolayers. 1. Reflectivity and
Grazing Incidence Diffraction at the Air/Water Interface," Joseph Strzalka,
Xiaoxi Chen, Christopher C. Moser, P. Leslie Dutton, Benjamin M. Ocko, and
J. Kent Blasie, Langmuir, 16, 10404-10418.
the appendix describes the first application of box refinement to reflectivity data from a liquid interface.
"Phase determination of x-ray reflection coefficients," K.-M. Zimmermann, M. Tolan, R. Weber, J. Stettner, A. K. Doerr, and W. Press Phys. Rev. B, 62 10377-10382.
1998
"Exact determination of the phase in neutron reflectometry by variation of the surrounding media," C. F. Majkrzak and N. F. Berk Phys. Rev. B, 58 15416-15418.
1995
"Exact determination of the phase in neutron reflectometry," C. F. Majkrzak and N. F. Berk Phys. Rev. B, 52 10827-10830.
"Retrieval of phase information in neutron reflectometry," V.-O. de Haan, A. A. van Well, S. Adenwalla and G. P. Felcher Phys. Rev. B, 52 10831-10833.
1993
"Phase determination in x-ray and neutron reflectivity using logarithmic dispersion relations," William L. Clinton, Phys. Rev. B, 48 1-5.
1990
"X-ray specular reflection studies of silicon coated by organic monolayers (alkylsiloxanes),"
I. M. Tidswell, B. M. Ocko, P. S. Pershan, S. R. Wasserman, G. M. Whitesides and J. D. Axe, Phys. Rev. B,
41 1111.
1976
"The Phase Problem,"
R. E. Burge, M. A. Fiddy, A. H. Greenaway, G. Ross,
Proc. R. Soc. Lond. A, 350 191-212.
This study contains a very compact treatment of slab models for computing reflectivity, but note that in equation 5 on page 1113, the argument of the error function should be z/[sqrt(2)sigma] for the derivative to be as given by equation 6.